Electron Microscopy Laboratory

Scanning Electron Microscopy (SEM) allows the acquisition of high-resolution three-dimensional images (approximately 100 Å) by scanning a beam of electrons over a small area of the sample under investigation. The interaction between the electron beam and the material generates various signals which, when properly detected, allow the production of images with high contrast and large depth of field, enabling detailed study of the sample morphology. This technique allows the analysis of shape, size, roughness, and micro- and nanostructural organization of biological samples or other materials, proving particularly useful for morphological characterization in numerous scientific fields. SEM is widely applied both in biological sciences and materials science, enabling observations at high magnifications, typically ranging from 10× to 100,000×.