Skip to Main Content (Press Enter)

Logo UNIME
  • ×
  • Home
  • Degrees
  • Courses
  • Jobs
  • People
  • Outputs
  • Organizations
  • Third Mission
  • Expertise & Skills

Expertise & Skills
Logo UNIME

|

UNIFIND - Expertise & Skills

unime.it
  • ×
  • Home
  • Degrees
  • Courses
  • Jobs
  • People
  • Outputs
  • Organizations
  • Third Mission
  • Expertise & Skills
  1. Outputs

Particle production as a function of charged-particle flattenicity in pp collisions at sqrt(s) = 13TeV

Academic Article
Publication Date:
2025
abstract:
This paper reports the first measurement of the transverse momentum (pT) spectra of primary charged pions, kaons, (anti)protons, and unidentified particles as a function of the charged-particle flattenicity in pp collisions at s=13 TeV. Flattenicity is a novel event shape observable that is measured in the pseudorapidity intervals covered by the V0 detector, 2.8<η<5.1 and -3.7<η<-1.7. According to QCD-inspired phenomenological models, it shows sensitivity to multiparton interactions and is less affected by biases toward larger pT due to local multiplicity fluctuations in the V0 acceptance than multiplicity. The analysis is performed in minimum-bias (MB) as well as in high-multiplicity events up to pT=20 GeV/c. The event selection requires at least one charged particle produced in the pseudorapidity interval |η|<1. The measured pT distributions, average pT, kaon-to-pion and proton-to-pion particle ratios, presented in this paper, are compared to model calculations using pythia 8 based on color strings and EPOS LHC. The modification of the pT-spectral shapes in low-flattenicity events that have large event activity with respect to those measured in MB events develops a pronounced peak at intermediate pT (2<8 GeV/c), and approaches the vicinity of unity at higher pT. The results are qualitatively described by pythia, and they show different behavior than those measured as a function of charged-particle multiplicity based on the V0M estimator.
Iris type:
14.a.1 Articolo su rivista
List of contributors:
Acharya, S.; Adamová, D.; Agarwal, A.; Aglieri Rinella, G.; Aglietta, L.; Agnello, M.; Agrawal, N.; Ahammed, Z.; Ahmad, S.; Ahn, S.  u.; Ahuja, I.; Akindinov, A.; Akishina, V.; Al-Turany, M.; Aleksandrov, D.; Alessandro, B.; Alfanda, H.  m.; Alfaro Molina, R.; Ali, B.; Alici, A.; Alizadehvandchali, N.; Alkin, A.; Alme, J.; Alocco, G.; Alt, T.; Altamura, A.  r.; Altsybeev, I.; Alvarado, J.  r.; Alvarez, C.  o.  r.; Anaam, M.  n.; Andrei, C.; Andreou, N.; Andronic, A.; Andronov, E.; Anguelov, V.; Antinori, F.; Antonioli, P.; Apadula, N.; Aphecetche, L.; Appelshäuser, H.; Arata, C.; Arcelli, S.; Arnaldi, R.; Arneiro, J.  g.  m.  c.  a.; Arsene, I.  c.; Arslandok, M.; Augustinus, A.; Averbeck, R.; Averyanov, D.; Azmi, M.  d.; Baba, H.; Badalà, A.; Bae, J.; Baek, Y.  w.; Bai, X.; Bailhache, R.; Bailung, Y.; Bala, R.; Balbino, A.; Baldisseri, A.; Balis, B.; Banerjee, D.; Banoo, Z.; Barbasova, V.; Barile, F.; Barioglio, L.; Barlou, M.; Barman, B.; Barnaföldi, G.  g.; Barnby, L.  s.; Barreau, E.; Barret, V.; Barreto, L.; Bartels, C.; Barth, K.; Bartsch, E.; Bastid, N.; Basu, S.; Batigne, G.; Battistini, D.; Batyunya, B.; Bauri, D.; Bazo Alba, J.  l.; Bearden, I.  g.; Beattie, C.; Becht, P.; Behera, D.; Belikov, I.; Bell Hechavarria, A.  d.  c.; Bellini, F.; Bellwied, R.; Belokurova, S.; Beltran, L.  g.  e.; Beltran, Y.  a.  v.; Bencedi, G.; Bensaoula, A.; Beole, S.; Berdnikov, Y.; Berdnikova, A.; Bergmann, L.; Besoiu, M.  g.; Betev, L.; Bhaduri, P.  p.; Bhasin, A.; Bhattacharjee, B.; Bianchi, L.; Bielčík, J.; Bielčíková, J.; Bigot, A.  p.; Bilandzic, A.; Biro, G.; Biswas, S.; Bize, N.; Blair, J.  t.; Blau, D.; Blidaru, M.  b.; Bluhme, N.; Blume, C.; Boca, G.; Bock, F.; Bodova, T.; Bok, J.; Boldizsár, L.; Bombara, M.; Bond, P.  m.; Bonomi, G.; Borel, H.; Borissov, A.; Borquez Carcamo, A.  g.; Botta, E.; Bouziani, Y.  e.  m.; Bratrud, L.; Braun-Munzinger, P.; Bregant, M.; Broz, M.; Bruno, G.  e.; Buchakchiev, V.  d.; Buckland, M.  d.; Budnikov, D.; Buesching, H.; Bufalino, S.; Buhler, P.; Burmasov, N.; Buthelezi, Z.; Bylinkin, A.; Bysiak, S.  a.; Cabanillas Noris, J.  c.; Cabrera, M.  f.  t.; Cai, M.; Caines, H.; Caliva, A.; Calvo Villar, E.; Camacho, J.  m.  m.; Camerini, P.; Canedo, F.  d.  m.; Cantway, S.  l.; Carabas, M.; Carballo, A.  a.; Carnesecchi, F.; Caron, R.; Carvalho, L.  a.  d.; Castillo Castellanos, J.; Castoldi, M.; Catalano, F.; Cattaruzzi, S.; Ceballos Sanchez, C.; Cerri, R.; Chakaberia, I.; Chakraborty, P.; Chandra, S.; Chapeland, S.; Chartier, M.; Chattopadhay, S.; Chattopadhyay, S.; Chattopadhyay, S.; Chen, M.; Cheng, T.; Cheshkov, C.; Chibante Barroso, V.; Chinellato, D.  d.; Chizzali, E.  s.; Cho, J.; Cho, S.; Chochula, P.; Chochulska, Z.  a.; Choudhury, D.; Christakoglou, P.; Christensen, C.  h.; Christiansen, P.; Chujo, T.; Ciacco, M.; Cicalo, C.; Ciupek, M.  r.; Clai, G.; Colamaria, F.; Colburn, J.  s.; Colella, D.; Colelli, A.; Colocci, M.; Concas, M.; Conesa Balbastre, G.; Conesa Del Valle, Z.; Contin, G.; Contreras, J.  g.; Coquet, M.  l.; Cortese, P.; Cosentino, M.  r.; Costa, F.; Costanza, S.; Cot, C.; Crochet, P.; Cruz-Torres, R.; Czarnynoga, M.  m.; Dainese, A.; Dange, G.; Danisch, M.  c.; Danu, A.; Das, P.; Das, P.; Das, S.; Dash, A.  r.; Dash, S.; De Caro, A.; De Cataldo, G.; De Cuveland, J.; De Falco, A.; De Gruttola, D.; De Marco, N.; De Martin, C.; De Pasquale, S.; Deb, R.; Del Grande, R.; Dello Stritto, L.; Deng, W.; Devereaux, K.  c.; Dhankher, P.; Di Bari, D.; Di Mauro, A.; Diab, B.; Diaz, R.  a.; Dietel, T.; Ding, Y.; Ditzel, J.; Divià, R.; Djuvsland, Ø.; Dmitrieva, U.; Dobrin, A.; Dönigus, B.; Dubinski, J.  m.; Dubla, A.; Dupieux, P.; Dzalaiova, N.; Eder, T.  m.; Ehlers, R.  j.; Eisenhut, F.; Ejima, R.; Elia, D.; Erazmus, B.; Ercolessi, F.; Espagnon, B.; Eulisse, G.; Evans, D.; Evdokimov, S.; Fabbi
Authors of the University:
MANDAGLIO Giuseppe
TRIFIRO' Antonio
Handle:
https://iris.unime.it/handle/11570/3349973
Published in:
PHYSICAL REVIEW D
Journal
  • Guide
  • Help
  • Accessibility
  • Privacy
  • Use of cookies
  • Legal notes

Powered by VIVO | Designed by Cineca | 26.4.5.0