Intrusion-Extrusion Experiments of MgCl2 Aqueous Solution in Pure Silica Ferrierite: Evidence of the Nature of Intruded Liquid by in situ High Pressure Synchrotron X-ray Powder Diffraction
Articolo
Data di Pubblicazione:
2016
Abstract:
Experimental intrusion-extrusion isotherms of MgCl221H2O solution were recorded at room temperature
on pure silica FER-type zeolite (Si-FER). The intrusion occurs at 195 MPa and the phenomenon is
completely reversible with a slight hysteresis. The “Si-FER - MgCl2 aqueous solution” system behaves like
a spring. The material was deeply characterized before and after intrusion-extrusion experiments and no
significant changes were observed. The unit cell parameters were refined e on the basis of the in situ
synchrotron X-ray powder diffraction data - up to 1.47 GPa and then at Pamb upon pressure release. The
Rietveld refinement of the data collected at 0.28 GPa (280 MPa), a pressure close to the intrusion value,
shows that both ions and water molecules present in the MgCl2 aqueous solution were intruded in the
porosities. However, the solvation degree of the intruded ions differs from the initial solution, revealing a
partial desolvation of both magnesium and chloride ions. As a whole, the nature and amount of the
intruded species correspond to a MgCl210H2O composition. Moreover, at a higher pressure (0.68 GPa), a
phase transition from the orthorhombic Pmnn to the monoclinic P21/n s.g. is observed in Si-FER. At
1.47 GPa, the zeolite maintains this monoclinic symmetry, while another phase transition, to the
monoclinic P21 s g., is argued from the analysis of the pattern of the sample compressed to 2.6 GPa and
then collected upon pressure release to ambient conditions.
Tipologia CRIS:
14.a.1 Articolo su rivista
Keywords:
FER-type zeolite, Pure silica ferrierite, Intrusion-extrusion experiments, In-situ high pressure synchrotron XRPD experiments, Structural refinement
Elenco autori:
Arletti, Rossella; Ronchi, Laura; Quartieri, Simona; Vezzalini, Giovanna; Ryzhikov, Andrey; Nouali, Habiba; Jean Daou, T.; Patarin, Joel
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